FS 2
FS 2: Advanced Loading & Diagnostics for Dynamic Events & Workshop on Advanced X-ray Sources and Diagnostics-2017
This symposium is targeted at novel loading and diagnostic techniques for dynamic events, including magnetic and laser drivers, and novel diagnostics based on advanced electron and x-ray sources, for example, ultrafast electrons, hard X-ray free electron lasers and third-generation synchrotrons. It is combined with Workshop on Advanced X-ray Sources and Diagnostics initiated by the Peac Institute of Multiscale Sciences. Subjects in experiments, theory/modeling, and scientific applications are all welcome.

S.N. Luo (PIMS)
Important Dates
Aug. 19th (Sat) to 24th (Thu), 2017
(Aug. 19 to 23, 2017: Scientific Program)

Abstract Submission Opens:
Jan. 30th, 2017

Early Bird Registration Due:
Apr. 30th, 2017

Abstract Submission Due:
May 30th, 2017

Advanced Registration Due:
Aug. 10th, 2017

Manuscript Submission Due:
Aug. 23rd, 2017